Latest News
- NanoScientific Magazine, Park Systems Special Edition 13 January 2022
- Powerful New Semiconductor Tool Introduced by Park Systems Combines Atomic Force Microscopy with White Light Interferometry 16 November 2021
- Park Systems Announces Park FX40, the Autonomous AFM with Built-in Intelligence – A Groundbreaking New Class of Atomic Force Microscope 24 June 2021
- Park Systems, Global Leader in Atomic Force Microscopy, Appoints Dr. Stefan Kaemmer as President, Park Systems Americas 23 June 2021
- NanoScientific Magazine, Summer 2021 22 June 2021
Technical Articles
- Surface potential measurements of 2D materials in high vacuum 22 December 2021
- MFM on Mn1.4PtSn: Investigating magnetic hosts for Anti-Skyrmions 17 December 2021
- Quantitative frictional properties measurement using atomic force microscopy 18 October 2021
- Surface Potential Characterization of Two-Dimensional Materials through Back-Gate Voltage Biases 27 September 2021
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