HDD manufacturing with Park Systems' precision AFMs engineered for the demanding requirements of head and media metrology. The NX-PTR delivers nanoscale surface characterization for HDD heads, enabling accurate roughness and topography measurements critical to read/write performance. The NX-HDM provides automated defect detection for HDD substrates and media, ensuring consistent quality control across high-volume production lines. Together, they empower process engineers with reliable, repeatable data to drive yield improvement and tighten manufacturing tolerances. Where HDD precision matters most, Park Systems delivers.
