Park NX1
The highest resolution AFM
Park NX1 is a compact AFM designed for high-resolution imaging with stable operation. The system combines a mechanically rigid structure with a thermally stable body to support atomic-scale imaging in ambient conditions while maintaining the ease of use typical of Park Systems instruments.
A minimal mechanical loop between the probe and the sample improves mechanical stability. The AFM core body is made of Kovar to reduce thermal drift. The system includes a XYZ tube scanner for imaging and a tungsten carbide stick–slip stage with kinematic contacts for Z approach.
The sample can be positioned using stick–slip XY motion. An on-axis optical microscope allows observation of both the probe and the sample during operation. The system supports standard AFM probes as well as optional qPlus (quartz tuning fork) sensors.
Key Features
Optimized AFM Architecture
The NX1 features a compact, mechanically rigid architecture that minimizes the probe-to-sample mechanical loop, enabling low noise and high stability. A precision XYZ tube scanner combined with a tungsten carbide stick–slip stage and kinematic contacts enables stable positioning, while low thermal expansion materials reduce drift for consistent atomic-resolution imaging.
Intuitive Laser Beam Alignment
The NX1 uses a beam-bounce detection system with a separated detection module to preserve measurement stability. The intuitive alignment design simplifies setup and enables fast laser positioning on the cantilever, supporting stable signal detection.
Low Noise Performance
The NX1 achieves a noise floor about an order of magnitude lower than typical AFM systems, enabled by its optimized architecture. This low noise level provides a stable measurement environment, supporting consistent signal detection and atomic-resolution imaging.
On-Axis Optical Microscope
The NX1 features a high-resolution on-axis optical microscope that provides a direct view of both the probe and sample, enabling accurate tip positioning and efficient sample navigation. Integrated illumination provides clear visibility across sample types, simplifying setup and supporting reliable measurements.
qPlus Sensor Option
The NX1 supports an optional qPlus sensor based on a quartz tuning fork for advanced atomic-scale measurements. Its high stiffness enables stable operation at picometer-scale amplitudes, minimizing jump-to-contact.
Softwares
