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Park FX40​
A Groundbreaking New Class of Atomic Force Microscope
for Nanoscientific Research: The Autonomous AFM
Effortlessly, get the sharpest, clearest, highest resolution images one sample after another on multiple applications. Boost your progress and scientific discoveries through unprecedented speed and accuracy – as the Park FX40 infuses artificial intelligence with robotics, enabling automated processes and machine learning for your nanoscale microscopy needs. Additional axis cameras automatically align in synch with laser beams and photodetectors. Early warning systems and fail-safes, in addition to information extraction and storage at every step of the way allows scientists and researchers like you to push past human limits – all without specialized microscopy training.
Effortlessly, get the sharpest, clearest, highest resolution images one sample after another on multiple applications. Boost your progress and scientific discoveries through unprecedented speed and accuracy – as the Park FX40 infuses artificial intelligence with robotics, enabling automated processes and machine learning for your nanoscale microscopy needs.

FX40 Product Video

The Most Intelligent AFM
Ever Experienced with
AI Robotics Technology ​

With the simple click of a button, Park FX40 automatically changes and
replaces its own tips, to avoid any contamination or user-related errors.
Operators are offered tip choices including the type, model, application, and usage.



Auto Probe Exchange

With automated probe exchange, users can now replace old probes easily and safely in full automation. Harnessing the convenience of an 8-probe cassette, along a magnetic controlled mechanism, probes can be mounted without the user handling them.



Auto Probe Reading

The Probe Identification Camera reads the QR code imprinted on the chip carrier of a newly loaded probe and extracts and displays all pertinent information on each of the tips available, including the type, model, application, and usage. This enables you to select the best probe tip for each job.


Auto Beam Alignment

Automatic Beam Alignment positions the SLD beam onto the proper location of a cantilever and further optimizes the PSPD position both vertically and laterally. One simple click shifts the X,Y and Z axis for clearer images, with no distortion.

Automatic Probe Pairing
to Sample Locations

Play Video
Sample Camera

With storage capacity for up to four different samples simultaneously on the chuck, the sample camera effortlessly locates the most relevant spot for scanning.

Play Video
Probe Identification Camera

Uses the right tool for the right job, with the probe Identification camera. Instantly accesses information on each of the tips available, including the type, model, application, and usage. It then selects your probe with the click of a button.

Get Smarter with
Machine Learning​ ​

Park FX40 uses machine learning to automatically detect whether probes are correctly positioned. Smart vision takes it one step further by locating the position of a loaded probe to a nano level and generating error status reports if necessary, instantly comparing this data to tens of thousands of possible simulated issues which are continuously upgraded through software updates. ​

The Fastest, Most Accurate,
True Non-contact Mode
Ever in an AFM


The True Non-contact mode achieves unprecedented control over tip-sample distance at the sub-nanometer scale.
The Park FX40 has a faster and more accurate True Non-contact mode than any other AFM on the market.

Safety Features

Safety probe landing – Maximizing to protect your sample

New tip crash prevention protects the tip and AFM scanner using a combination of software interlock and hardware switch. Through algorithmic programming, the Z stage can’t physically go down any further than the limit of tip collision with the sample surface, allowing you peace of mind for the safety of your sample and AFM.




Environmental Sensors

SmartScan displays and stores measurements from sensors, which measure essential environmental conditions such as temperature, humidity, leveling and vibration. This allows you to compare your scanned images with different environmental channels, providing further environmental indicators for system diagnosis.


Safety Probe Pickup

Built-in robotics and a machine-learning algorithm detect and warn you about incorrectly placed probes, since you can use either the automatic or manual tip loading feature. Access various error status report during probe loading to make sure you have the highest degree of accuracy.

The best AFM experience – Park OS SmartScan for FX Simplicity from start to scan with a simple click

1. Setup

Auto Setting

It does all your setup such as automatically probe change, laser alignment for imaging with animated instructions for setup anyone can understand.

2. Position

Sample Navigation

Your new AFM automatically performs a frequency a sweep for the cantilever, approaches the Z-stage to the sample, and auto focuses, allows you more freedom to navigate to your area of interest for imaging.

3. Image

Dynamic Scanning

The system sets all the necessary parameters for optimum setting, then engages the cantilever and starts scanning the sample. It continues to scan until the image is acquired and completed.

Park Engineer's Talk

Park FX40 Specs

XY Scanner

Structure


▪ Single-module, parallel-kinematic 2D flexure scanner
▪ Better symmetry than serial-kinematic flexure scanner

XY scan range


▪ 100 µm x 100 µm
Z Scanner

Structure


▪ Flexure-guided high-force scanner
▪ Better symmetry than serial-kinematic flexure scanner

Z scan range


▪ 15 µm
Sample mount

Mounting


▪ Magnetic holder (Max. 4 sample disc)
▪ FX Snap-in Sample Disk for Multi Snap-in Sample Chuck
Stages

Z stage travel range


▪ 22 mm (Motorized)
Visions and optics

Vision path


▪ On-axis sample view from top
▪ The same view as an optical microscope

CCD


▪ 5.1 M Pixel
▪ Pixel size: 3.45 μm x 3.45 μm
AFM Controller

Lock-in amp


▪ 4 channels integrated DC - 5 MHz


Accessories

Probe exchange


▪ Probe exchange in less than 1 minutes using Automated Probe Exchange
(No need to remove head to exchange cantilevers)


Probe mount


▪ Pre-aligned mount using chip carrier

Park FX40

f0 test 2

Park FX40 | The Autonomus AFM