Polymer Composite
Scanning Conditions
- System: Park FX40
- Scan Mode: True Non-contact™ mode
- Scan Rate: 0.5 Hz
- Scan Size: 10 µm × 10 µm
- Pixel Size: 512 × 512 pixels
- Peak-to-valley: 8.2 nm
Related Contents
Application Talks
Imaging Müller Matrix Ellipsometry for Quantifying Dielectric Tensors of Molecular Microcrystals as well as Analyzing Engineered Microstructures
Application Talks
Giant Optical Anisotropy and High Refractive Index in van der Waals Materials
System Webinars
Spectroscopic Imaging Ellipsometry at Cryogenic Temperatures Applied to Atomically Thin Crystals
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