Polymer Composite
Scanning Conditions
- System: Park FX40
- Scan Mode: True Non-contact™ mode
- Scan Rate: 0.5 Hz
- Scan Size: 10 µm × 10 µm
- Pixel Size: 512 × 512 pixels
- Peak-to-valley: 8.2 nm
Related Contents
System Webinars
Deeper insights into 2D-Materials and related Microcrystals by Imaging Spectroscopic Ellipsometry (ISE) and Imaging Mueller Matrix Ellipsometry (IMME)
Application Talks
Imaging Müller Matrix Ellipsometry for Quantifying Dielectric Tensors of Molecular Microcrystals as well as Analyzing Engineered Microstructures
Application Talks
Giant Optical Anisotropy and High Refractive Index in van der Waals Materials
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