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For the webinar schedule – see below.

To obtain reliable surface information via atomic force microscopy (AFM), the scientist or engineer needs to select a suitable cantilever/tip for each imaging mode, adjust the imaging position and optimize the scan parameters. In the past, the complex operation and handling has limited the wide-scale application of AFM in academic and industrial research.

This webinar series will show you how the new Park FX40 Automated AFM overcomes these previous hurdles by introducing the innovative and simplified standards in AFM nanoimaging. We will give practical demonstrations to highlight that the FX40 opens AFM to a large audience via intelligent scan algorithms, fully automated tip handling, detection systems alignment and tip approach, as well as a multi-sample chuck, which are implemented into the next-gen AFM tool.

The experimental set-up that hosts up to four samples on the muti-sample chuck and up to eight different cantilevers via the automated tip exchange, allows conducting your experiment remotely without the necessity to come to the lab or the clean room for sample or tip changes.

With the FX40 AFM, you can obtain reproducible high-resolution quality data with just a few clicks, making material’s investigation at nanoscale accessible to everyone.

 

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Wednesday, 2 February: Empowering your Research: Intuitive AFM operation with new auto-functions  

FAMT FLYER 2

 

 

2

Wednesday, 16 February: Empowering your AFM data: High Resolution imaging with automated AFM   

FAMT FLYER 2

 

   

2

Wednesday, 2 March: Empowering advanced imaging: how AFM automation helps in PinPoint nanomechanical investigation at nanoscale  


FAMT FLYER 2

 

  

2

Wednesday, 30 March: Empowering your time: Conduct a full experiment remotely from your couch or elsewhere! 

FAMT FLYER 2

 

Meetings & Exhibits