Park FX40 IR
The non-contact AFM for small-sample chemical imaging
Park FX40 IR is Park Systems’ advanced AFM solution for nanoscale infrared spectroscopy and imaging, combining chemical and surface characterization. It is built on the proven FX40 platform supporting small samples. With a low noise floor, minimal thermal drift, and enhanced mechanical stability, FX40 delivers unmatched precision and reliability.
Park FX40 IR is a nano-IR spectrometer based on Photo-induced Force Microscopy (PiFM), enabling both IR spectral analysis and chemical imaging at the nanoscale. Like all Park AFMs, it features an orthogonal scan system and True Non-contact™ mode, delivering consistent, non-invasive measurements even on fragile samples.
Automation features such as automatic probe exchange, IR beam alignment, and multi-point measurement streamline operation and simplify workflows.
Park FX40 IR is a nano-IR spectrometer based on Photo-induced Force Microscopy (PiFM), enabling both IR spectral analysis and chemical imaging at the nanoscale. Like all Park AFMs, it features an orthogonal scan system and True Non-contact™ mode, delivering consistent, non-invasive measurements even on fragile samples.
Automation features such as automatic probe exchange, IR beam alignment, and multi-point measurement streamline operation and simplify workflows.
Key Features
By combining high-performance AFM with advanced IR capability, FX40 IR provides a powerful platform for precise and efficient nanoscale chemical characterization.
Since FX40 IR combines Park FX40 and Park nano-IR spectrometers, explore each product’s core features on dedicated pages.
Reliable Nano-IR Analysis
Park Advanced AFM Technology
Photo-induced Force Microscopy
Photo-induced Force Microscopy (PiFM) detects photo-induced forces generated by resonant molecular vibrations excited with a tunable IR laser. In Park FX200 IR, the AFM cantilever operates in Non-contact™ mode to measure local IR absorption without touching the sample, enabling spectral and chemical mapping with sub-5 nm spatial resolution and monolayer sensitivity.
Applications
Flexible Upgrade Path
Future-Ready, On Your Timeline
Start with the FX40 (IR-upgradeable system) first, then expand to nano-IR capabilities later without changing platforms. A flexible upgrade path designed to adapt to evolving research priorities and investment plans.
