Developed for
High Resolution Electrical Studies

Park Heterodyne KPFM

System Compatibility

• Included in Park FX Series
30% Early Bird Discount Ongoing (~ June 30)

•

Available via Paid Hardware Upgrade on Park NX Series * Excluding Park NX20 Lite & NX7

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Application Note

Discover the Breakthrough Behind Park Heterodyne KPFM

Setting a new standard in AFM imaging technology, Park Heterodyne KPFM delivers next-level performance and precision to power your next research endeavor. Dive into our application note to explore validated results and the breakthrough capabilities behind the heterodyne technique.

View App Note

Get to Know the Park Heterodyne KPFM

The Heterodyne Effect

How Does it Work?

Kelvin Probe Force Microscopy (KPFM) is a widely used AFM technique for quantitative measurement of surface potential and work function. Park Heterodyne KPFM advances this established method with a novel approach — leveraging second harmonic signal detection, which offers a higher Q factor and significantly reduces topographic crosstalk when measuring contact potential difference (CPD). Optimized for applications such as 2D materials, semiconductors, and nanostructured surfaces, Park Heterodyne KPFM delivers superior clarity and accuracy in nanoscale electrical characterization.

Refined Sensitivity

Application image demonstrating heterodyne KPFM performance

The Park Heterodyne KPFM offers superior resolution and sensitivity compared to traditional KPFM methods by delivering precise data through accurate signals directed to the closest areas of the AFM's cantilever tip from the specific desire point. In contrast, *AM-KPFM detects signals from multiple parts, such as the tip end, tip side, and wide areas of the cantilever, which can cause signal averaging.

*AM-KPFM (Amplitude-Modulation KPFM)

Exceptional Performance in
High Resolution Electrical Studies

Research results show that the Park Heterodyne KPFM method delivers significantly more quantitative and reliable results compared to conventional AM-KPFM. Unlike AM-KPFM, which can be influenced by stray electric fields, Park Heterodyne KPFM minimizes these effects — achieving up to ~99% agreement with ideal values, whereas AM-KPFM shows approximately ~60% accuracy. This makes Park Heterodyne KPFM a powerful choice for precise surface potential mapping, especially in advanced electrical studies.

Average Matching Rate to Ideal Measurement:

Park Heterodyne KPFM

99%

AM-KPFM

60%

Ideal Measurement (Baseline)

100%

*The performance rate showcased here is based on performance tests conducted in accordance with the methodology outlined in the publication by Amelie Axt, Ilka M. Hermes, Victor W. Bergmann, Niklas Tausendpfund, and Stefan A. L. Weber — 'Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices.'

Durable Reliability for Faster Measurements.
Powering Your Research Productivity.

Experience higher speed measurements without compromising accuracy. Even at elevated scan speeds Park Heterodyne KPFM delivers spatial resolution compared to conventional AM-KPFM, helping you save valuable time and streamline your workflow.

Preserving Spatial Resolution Comparable to AM-KPFM,
Even at 20x Faster Measurement Speeds:

AM-KPFM