Our comprehensive portfolio features cutting-edge technologies, including atomic force microscopy (AFM) with proprietary True Non-Contact™ imaging, white light interferometry (WLI) for nanometer-scale surface analysis, nano-infrared spectroscopy (nano-IR) for chemical characterization, imaging spectroscopic ellipsometry (ISE) for thin film measurement, and digital holographic microscopy (DHM) for advanced 3D profiling.
At the forefront of innovation, Park Systems has redefined nanoscale measurement through groundbreaking developments such as high-precision 3D metrology systems and fully automated AFM solutions, all engineered to meet the exacting requirements of both cutting-edge research and high-volume industrial applications.
History
1982 - 1996
The advent and commercialization of AFM
In 1985, Sang-il Park was a PhD student on Professor Calvin Quate’s team at Stanford, which co-invented atomic force microscopy (AFM) with IBM. After graduating in 1988, Dr. Park founded Park Scientific Instruments (PSI) to commercialize AFM. PSI launched several AFM products for academia and industry before being acquired by Thermo Spectra in 1997.
1982 - 1996
The advent and commercialization of AFM
In 1985, Sang-il Park was a PhD student on Professor Calvin Quate’s team at Stanford, which co-invented atomic force microscopy (AFM) with IBM. After graduating in 1988, Dr. Park founded Park Scientific Instruments (PSI) to commercialize AFM. PSI launched several AFM products for academia and industry before being acquired by Thermo Spectra in 1997.
Polymer
•HDD (Hard Disk Drive)
•Magnetic Tape
Sang-il Park
Chairman
•CEO, Park Systems Corp. (1997~)
•President, Institute of Control, Robotics, and Systems (2024)