Empowering advanced imaging: how AFM Automation helps in nanomechanical PinPoint investigation at nanoscale
SPEAKERS
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Andrea Cerreta
Principal Scientist at Park Systems Europe
Dr. Andrea Cerreta is an Application Scientists at Park Systems Europe, where he focuses on application development and support for the academic sector. He received his Ph.D. in Physics from the Ecole Polytechnique Fédérale de Lausanne (EPFL), Switzerland. He did his further doctoral work at the Solid State Physics Group of Université de Fribourg, Switzerland, which focused on studying electrical and magnetic properties of organic spin valves and spin polarized currents in superconducting materials, grown by means of Pulsed Laser Deposition, and characterizing the DC and AC transport properties of magnetic and superconducting samples. His expertise also spans the Frequency Modulation Atomic Force Microscopy in UHV for the study of biomolecules.
- Access Speaker Publications
SPEAKERS
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- Andrea Cerreta
- Principal Scientist at Park Systems Europe
Authors
Check out all webinars from the Empowering AFM Imaging series here.
Scanning probe-based mechanical measurements allow retrieving nanoscale properties of a wide range of both elastically and inelastically deformable samples. Such a methodology can be applied to study the composition and mechanical behaviour of polymeric blends, soft tissues, or fibers, and performing hardness tests on stiff materials.
Park Systems PinPoint™ is a scanning mode that allows recording topography maps of the sample surface and extracting quantitative nanomechanical data at the same time. In PinPoint mode, fast forward/backward force cycles at ever pixel of the sample are recorded and analysed in real time in order to provide simultaneous maps of the tip adhesion, sample deformation, stiffness and Young’s modulus. The full data volume is also recorded.
The new Park Systems FX40 AFM improves the application of PinPoint and all Park advanced modes by combining it with automatic tip exchange and alignment. In this webinar, we will explore these features, seeing how users can test levers with different properties (e.g. spring constant or apex radius) on the same sample in order to optimize the selection of the correct probe.
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