tBG/hBN
2024-06-28 00:00:00
Scanning Conditions
- System: Park FX200
- Scan Mode: Conductive AFM (C-AFM)
- Scan Rate: All 10 Hz
- Scan Size: 100 nm², 25 nm²
- Pixel Size: 512×256, 256×128
- Sample Bias: All 1 V
- Cantilever: AD-2.8-AS (k=2.8 N/m, f=75 kHz)
Related Contents
System Webinars
Deeper insights into 2D-Materials and related Microcrystals by Imaging Spectroscopic Ellipsometry (ISE) and Imaging Mueller Matrix Ellipsometry (IMME)
Application Talks
Imaging Müller Matrix Ellipsometry for Quantifying Dielectric Tensors of Molecular Microcrystals as well as Analyzing Engineered Microstructures
Application Talks