News
Park NX Wafer Atomic Force Mircroscope
"Park NX Wafer, bare wafer ADR is the most advanced, fully automated defect review solution available -designed for leaders in Se...
The cover image shows the world’s first observation of rat tracheal tissue in an aqueous environment. The luminal surface of the trachea tissue was successf...
18
May 2014'
Newsletters
Q2 2014
EVENTS
2014 International Conference on Nanoscience ...
Dr. Sang-il Park, CEO & Founder Park Systems
“We have become the leader in nanotechnology design by constantly outperforming our competition, and creating ways to ...
20
Apr 2014'
Newsletters
Park Systems Inc Newsletter - Q2, 2014
Contents
• Message from President• Spotlight on Employee• Park Systems CEO Dr. Sang-il Park Presenter at MRS Spr...
Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, proudly introduces the Automatic Defect Review (ADR)AFM for 300mm bare wafers, a fully aut...
Park Systems, a leading manufacturer of Atomic Force Microscopy systems since 1997 announced PinPoint Conductive AFM, an extremely accurate conductive measurement technol...