News
15, Jul 14'
Press-Release
Park NX Wafer Atomic Force Mircroscope
"Park NX Wafer, bare wafer ADR is the most advanced, fully automated defect review solution available -designed for leaders in Se...
15, Jul 14'
Press-Release
The cover image shows the world’s first observation of rat tracheal tissue in an aqueous environment. The luminal surface of the trachea tissue was successf...
18
May 2014'
Newsletters
Q2 2014
EVENTS
2014 International Conference on Nanoscience ...
22, Apr 14'
Press-Release
Dr. Sang-il Park, CEO & Founder Park Systems
“We have become the leader in nanotechnology design by constantly outperforming our competition, and creating ways to ...
20
Apr 2014'
Newsletters
Park Systems Inc Newsletter - Q2, 2014
Contents
• Message from President• Spotlight on Employee• Park Systems CEO Dr. Sang-il Park Presenter at MRS Spr...
2, Apr 14'
Press-Release
Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, proudly introduces the Automatic Defect Review (ADR)AFM for 300mm bare wafers, a fully aut...
7, Mar 14'
Press-Release
Park Systems, a leading manufacturer of Atomic Force Microscopy systems since 1997 announced PinPoint Conductive AFM, an extremely accurate conductive measurement technol...
