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5, Nov 14'
Press-Release
LDPE characterized by PinPoint Nanomechanical  PinPoint™ Nanomechanical acquires images simultaneously and in real-time by taking the high speed force-distance curv...
29, Sep 14'
Press-Release
High resolution topography image of polymer fiber network collected using True Non-Contact™ mode. The image shows the interwoven network of polymer fibers  Park Ana...
12, Sep 14'
Press-Release
Keibock Lee, Park Systems President The live demos are a great way for us to offer education on Park Atomic Force Microscopy Imaging to further enhance the user experien...
5, Sep 14'
Press-Release
Dr. Rigoberto Advincula, Professor at Case Western Reserve University, Director of the PETRO Case Consortium at CWRU. The demanding applications of materials for th...
7, Aug 14'
Press-Release
Park Systems XE7-CR "Park AFM meets our rigid requirements for accurate measurements at the highest nanoscale resolution at a price we can afford."Dr. Gwo-Ching Wang, Pr...
15, Jul 14'
Press-Release
Park NX Wafer Atomic Force Mircroscope "Park NX Wafer, bare wafer ADR is the most advanced, fully automated defect review solution available -designed for leaders in Se...
15, Jul 14'
Press-Release
   The cover image shows the world’s first observation of rat tracheal tissue in an aqueous environment. The luminal surface of the trachea tissue was successf...
18
May 2014'
Newsletters
    Q2 2014         EVENTS 2014 International Conference on Nanoscience ...
22, Apr 14'
Press-Release
Dr. Sang-il Park, CEO & Founder Park Systems “We have become the leader in nanotechnology design by constantly outperforming our competition, and creating ways to ...

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