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  • Park
    NX7
    Atomic Force Microscope
    The affordable choice for
    the first step AFM research
    with the latest NX components

The most affordable research grade AFM with flexible sample handling

Park NX7 has all the state-of-the-art technology you have come to expect from Park Systems, at a price your lab can afford. Designed with the same attention to detail as our more advanced models, NX7 allows you to do your research on time and within budget.


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Accurate XY Scan by Crosstalk Elimination

  • Two independent, closed-loop XY and Z flexure scanners
  • Flat and orthogonal XY scan with low residual bow
  • Accurate height measurements without any need for software processing
 

The Most Extensible AFM Solution

  • The most comprehensive range of SPM modes
  • Advanced nanomechanical measurement modes are supported as default enabled by NX electronic controller
  • The best option compatibility and upgradeability in the industry
 

User Experience-Driven Software and Hardware Features

  • Open side access for easy sample or tip exchange
  • Easy, intuitive laser alignment with pre-aligned tip mount
  • Park SmartScanTM - AFM operating software versatile enough to empower both novices and power users alike toward great nanoscale research

Park NX7 - Overview | Park Atomic Force Microscope