Few layers of MnBi₂Te₄
2D Materials
Few-layer MnBi₂Te₄ (MBT), a material of interest in 2D materials research and topological insulators, was characterized in True Non-contact mode.
The scan image reveals the layered surface topography with a peak-to-valley height of about 85.9 nm.
Scanning Conditions
- System: NX7
- Scan Mode: True Non-contact™ mode
- Scan Rate: 1 Hz
- Scan Size: 40 µm × 40 µm
- Pixel Size: 256 × 256 pixels
- Peak-to-valley: 85.9 nm
• Sample courtesy: School of physical and mathematical sciences, Nanyang Technological University, Singapore
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