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    AFM Modes

Adaptable to any project

Electrical and Other Sample Characterization Modes

The wide range of scanning modes and module design of the NX series allows it to be easily tailored to the needs of any scanning probe microscopy project.Electrical-and-other-sample-modes

Park NX10 has the most extensive range of SPM modes (*Optionally available)

Park NX10 - AFM Modes | Park Atomic Force Microscope