-
IIT-chennai SSRM Hysteresys Au111 Lanthanum_aluminate ULCA Bmp Scratch OxideLayer HardDiskMedia Singapore PhaseChange LMF Aluminium_Oxide GaP frequency_modulation ForceDistanceSpectroscopy ImideMonomer hard_disk CrystalGrowing Electrical&Electronics ScanningIon-ConductanceMicroscopy LiquidCrystal Pzt Pores Patterns Bacterium Hexylthiophene SrTiO3 Solar Topography Lift Plug Copper IcelandSpar
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Polycrystalline ferroelectric BCZT
Scanning Conditions
- System: NX12
- Scan Mode: PFM
- Cantilever: ContscPt (k=0.2N/m, f=25kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 0.4Hz
- Pixel: 256×256
- Sample bias sweep range for Piezoresponse curve: -10V ~ +10V