Park AFM Image Gallery

Nanoscale defect analysis and device structure imaging for advanced semiconductor process development and quality control.

 

Nanoscale analysis of fine phase separation, surface roughness and various material properties for optimizing the functionality of polymer materials.

Evaluation of surface microstructure and local mechanical properties to enhance the functionality and durability of high-strength materials.

Ultra-precise characterization of deposited film thickness, roughness, and grain distribution for improving device quality.

Non-destructive imaging of dynamic changes, morphology, and elasticity of biological samples in a liquid environment.

In-depth analysis and manipulation of nanoscale materials using unique AFM capabilities.