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Park AFM Image Gallery

Discover the nanoscale world through Park Systems' curated AFM image collection. Browse images by application category below, or download the full Gallery Book for your research.

Image Gallery Books
Semiconductor
Nanoscale defect analysis and device structure imaging for advanced semiconductor process development and quality control.

 

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Polymer
Nanoscale analysis of fine phase separation, surface roughness and various material properties for optimizing the functionality of polymer materials.
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Metal & Ceramic
Evaluation of surface microstructure and local mechanical properties to enhance the functionality and durability of high-strength materials.
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Thin film
Ultra-precise characterization of deposited film thickness, roughness, and grain distribution for improving device quality.
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Life science
Non-destructive imaging of dynamic changes, morphology, and elasticity of biological samples in a liquid environment.
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AFM exclusive
In-depth analysis and manipulation of nanoscale materials using unique AFM capabilities.
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2d materials image gallery
2D-Materials
Atomic-level analysis of defects and electrical properties to realize the potential of 2D materials like Graphene.
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