SPIE Photonics West 2026

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Talk to our experts about the Park FX Series, equipped with automatic tip exchange and laser beam alignment, and discover advanced metrology solutions for photonics and semiconductor applications.

 

Explore Digital Holographic Microscopy (DHM), enabling non-contact, label-free 3D surface and phase imaging with nanometer-scale vertical resolution. DHM provides real-time, quantitative measurements of surface topography, thickness, and refractive index variations.
Learn more about the EP4 Imaging Spectroscopic Ellipsometer, delivering high-resolution, non-destructive thin-film characterization in film thickness.