Lecture #8: Electrostatic modes in AFM
SPEAKERS
  • Ben Schoenek
    Park Systems Inc., Santa Clara, California, USA
Authors
Ben Schoenek

Potential Charge Mapping:

Building on the basic AFM principles outlined in the first sessions, this lecture will cover the added electrostatic interaction between the sample and cantilever in potential charge mapping techniques. Discussion and questions are welcomed.

Interactive Demo Session:

Session will consist of demonstrating potential charge mapping on a semi-fluorinated alkane sample. AFM operator controls are highlighted with emphasis on linking the feedback loop to changed parameters and how these parameters change with the added electrostatic tip sample interaction.