Make the Most out of your Interactions: the Benefits of PinPoint Nanomechanical AFM
SPEAKERS
  • Alexander Klasen
    Park Systems Europe GmbH, Mannheim, Germany
Authors
Alexander Klasen

Abstract:
Noval high-tech materials share a common denominator: a careful design in the nanometer range. From functional polymer composites to wearable electronics or 2D materials, local variations in mechanical properties dictate the macroscopic properties. Here, atomic force microscopy offers more analytic insights beyond mere topography. In this webinar, we present how Park Systems’ PinPoint mode measures high-speed force-distance curves for each pixel which allows to study the mechanical properties like Young’s modulus, adhesion, or mechanical energy dissipation on a local scale. Moreover, PinPoint mode enables facile integration of other modes as conductive atomic force microscopy or piezo force microscopy and thus offers a holistic approach to nanoscale characterization.