Wednesday, June 24th
Speaker: Brian Choi, Senior Applications Scientist, Park Systems United States
Explore how SECCM on Park NX-AFM platform enables nanoscale electrochemical mapping beyond conventional techniques. Learn the fundamentals of nanopipette-based measurements and correlative AFM-SECCM analysis. Join this expert-led session to discover advanced electrochemical applications in catalysts, nanomaterials, 2D materials, and CO₂ reduction reduction applications.
Tuesday, July 7th
Speaker: Chris Jung, DHM Engineer, Optical Technology Support Team, Park Systems Corporation
Digital Holographic Microscopy (DHM) was applied to characterize a 300 mm bare glass wafer, enabling quantitative analysis of waviness, roughness, and local defects with nanometer-scale vertical sensitivity. The results demonstrate DHM as an effective non-contact solution for large-area glass wafer inspection. Join our upcoming webinar to explore how DHM can support advanced glass wafer metrology and large-area surface analysis applications.
Wednesday, Dec 2nd
Speaker: Ass. Prof. Tobias Cramer, Department of Physics and Astronomy, University of Bologna
This webinar explores how electrochemical strain wave microscopy is used to investigate transport processes in mixed ionic-electronic conductors under operando conditions. It will show how AFM-based strain measurements, combined with electrochemical impedance spectroscopy, reveal local ionic and electronic dynamics in materials such as conducting polymers, battery electrodes, thin films, and wires. Join to learn advanced AFM approaches for studying materials central to energy storage, bioelectronics, and neuromorphic computing.