Cu pad
2024-07-02 00:00:00

Cu pad

 

Scanning Conditions

- System: Park FX200
- Scan Mode: True Non-Contact™ Mode
- Scan Rate: 0.2 Hz
- Scan Size: 50 µm×50 µm
- Pixel Size: 512×512
- Cantilever: SCOUT 350 (k=42 N/m, f=350 kHz)

Application

Related Products

Related Modes

True Non-Contact™ Mode

Related Contents

System Webinars

Advanced Methods for Research into Ferroelectric Materials and Superlattices
System Webinars

Deeper insights into 2D-Materials and related Microcrystals by Imaging Spectroscopic Ellipsometry (ISE) and Imaging Mueller Matrix Ellipsometry (IMME)
Application Talks

Imaging Müller Matrix Ellipsometry for Quantifying Dielectric Tensors of Molecular Microcrystals as well as Analyzing Engineered Microstructures
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