SRAM
2024-06-28 00:00:00
Scanning Conditions
- System: Park FX200
- Scan Mode: Conductive AFM (C-AFM)
- Scan Rate: 1 Hz
- Scan Size: 1.5 µm×1.5 µm
- Pixel Size: 512×256
- Sample Bias: -1.5 V
- Cantilever: CDT-CONTR (k=0.5 N/m, f=20 kHz)
Application
Related Products
Related Modes
Conductive AFM (C-AFM)
Related Contents
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Advanced Methods for Research into Ferroelectric Materials and Superlattices
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