SRAM
2024-06-28 00:00:00
Scanning Conditions
- System: Park FX200
- Scan Mode: Conductive AFM (C-AFM)
- Scan Rate: 1 Hz
- Scan Size: 1.5 µm×1.5 µm
- Pixel Size: 512×256
- Sample Bias: -1.5 V
- Cantilever: CDT-CONTR (k=0.5 N/m, f=20 kHz)
Related Contents
Application Talks
Imaging Müller Matrix Ellipsometry for Quantifying Dielectric Tensors of Molecular Microcrystals as well as Analyzing Engineered Microstructures
Application Talks
Giant Optical Anisotropy and High Refractive Index in van der Waals Materials
System Webinars