SRAM
2024-06-28 00:00:00
Scanning Conditions
- System: Park FX200
- Scan Mode: Conductive AFM (C-AFM)
- Scan Rate: 1 Hz
- Scan Size: 1.5 µm×1.5 µm
- Pixel Size: 512×256
- Sample Bias: -1.5 V
- Cantilever: CDT-CONTR (k=0.5 N/m, f=20 kHz)
Related Contents
Application Talks
Giant Optical Anisotropy and High Refractive Index in van der Waals Materials
System Webinars
Spectroscopic Imaging Ellipsometry at Cryogenic Temperatures Applied to Atomically Thin Crystals
Application Talks