Defects of LiNbO3 wafer
Scanning Conditions
- System: FX40
- Scan Mode: True Non-Contact™ Mode
- Scan Rate: All 0.3 Hz
- Scan Size: All 8.5 µm×8.5 µm
- Pixel Size: All 512×256
- Cantilever: PPP-NCHR (k=42 N/m, f=320 kHz)
Related Contents
Application Talks
Imaging Müller Matrix Ellipsometry for Quantifying Dielectric Tensors of Molecular Microcrystals as well as Analyzing Engineered Microstructures
Application Talks
Giant Optical Anisotropy and High Refractive Index in van der Waals Materials
System Webinars
Spectroscopic Imaging Ellipsometry at Cryogenic Temperatures Applied to Atomically Thin Crystals
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