Graphite and h-BN

PiFM enables both IR spectral and spatial imaging analysis of a graphite/h-BN stacked heterostructure, clearly revealing how the IR response changes with different layer combinations and local stacking regions.


Scanning Conditions
- System: Nano-IR
- Scan Mode: PiFM
- Scan Size: 5 µm×5 µm
- Scan Rate: 0.5 Hz
- Pixel Size: 256x256 pixels
- Cantilever: PPP-NCHPt
(k=42 N/m, f=330 kHz)


*Data courtesy of Prof. Soobong Choi’s Research Group, Incheon National University

Related Modes

Photoinduced Force Microscopy (PiFM)

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