Park FX40

A New Class of Atomic Force Microscope: The Automatic AFM
Accelerate your research!

Effortlessly, get the sharpest, clearest, highest resolution images and measurements one sample after another on various applications. Boost your progress and scientific discoveries through unprecedented speed and accuracy – as the Park FX40 autonomously images and acquires data powered by its artificial intelligence, robotics and machine learning capability. The Additional axis cameras automatically align with laser beams and photodetectors. The early warning systems and fail-safes at every step of the way allow you to focus on your research and not the tool.
Effortlessly, get the sharpest, clearest, highest resolution images and measurements one sample after another on various applications. Boost your progress and scientific discoveries through unprecedented speed and accuracy – as the Park FX40 autonomously images and acquires data powered by its artificial intelligence, robotics and machine learning capability.

FX40 Product Video Brochure

The Most Intelligent AFM
Ever Experienced with
AI Robotics Technology

With the simple click of a button, Park FX40 automatically changes and
replaces its own tips, to avoid any contamination or user-related errors.
Operators are offered tip choices including the type, model, application, and usage.

Auto Probe Exchange

With automated probe exchange, users can now replace old probes easily and safely in full automation. Harnessing the convenience of an 8-probe cassette, along a magnetic controlled mechanism, probes can be mounted without the user handling them.

Auto Probe Reading

The Probe Identification Camera reads the QR code imprinted on the chip carrier of a newly loaded probe and extracts and displays all pertinent information on each of the tips available, including the type, model, application, and usage. This enables you to select the best probe tip for each job.

Auto Beam Alignment

Automatic Beam Alignment positions the SLD beam onto the proper location of a cantilever and further optimizes the PSPD position both vertically and laterally. One simple click shifts the X,Y and Z axis for clearer images, with no distortion.

Auto Probe Exchange
With automated probe exchange, you can now replace old probes easily and safely in full automation. Harnessing the convenience of an 8-probe cassette, along with a magnetic controlled mechanism, the Park FX40 autonomously mounts the probes.
Auto Probe Reading
The Probe Identification Camera reads the QR code imprinted on the chip carrier of a newly loaded probe and extracts and displays all pertinent information on each of the tips available, including the type, model, application, and usage. This enables you to quickly select the best probe tip for each job.
Auto Beam Alignment
Automatic Beam Alignment positions the laser beam onto the proper location of a cantilever and further optimizes the PSPD position both vertically and laterally. It shifts the X,Y and Z axis for clearer images, with no distortion, all autonomously at the click of a button.

Automatic Probe Pairing
to Sample Locations

Sample Camera
‍
With storage capacity for up to four different samples simultaneously on the chuck, the sample camera effortlessly locates the most relevant spot for scanning.

Probe Identification Camera

Uses the right tool for the right job, with the probe Identification camera. Instantly accesses information on each of the tips available, including the type, model, application, and usage. It then selects your probe with the click of a button.

Get Smarter with
Machine Learning
Park FX40 uses machine learning to automatically detect whether probes are correctly positioned. Smart vision takes it one step further by locating the position of a loaded probe to a nano level and generating error status reports if necessary, instantly comparing this data to tens of thousands of possible simulated issues which are continuously upgraded through software updates.

The Fastest and The Most Accurate,
Scanning Mode in
Atomic Force Microscopy

The True Non-contact mode achieves unprecedented control over tip-sample distance at the sub-nanometer scale.
The Park FX40 has a faster and more accurate True Non-contact mode than any other AFM on the market.

Safety Features

Safety probe landing – Maximizing to protect your sample

New tip crash prevention protects the tip and AFM scanner using a combination of software interlock and hardware switch. Through algorithmic programming, the Z stage can’t physically go down any further than the limit of tip collision with the sample surface, allowing you peace of mind for the safety of your sample and AFM.

Environmental Sensors

SmartScan displays and stores measurements from sensors, which measure essential environmental conditions such as temperature, humidity, leveling and vibration. This allows you to compare your scanned images with different environmental channels, providing further environmental indicators for system diagnosis.

Safety Probe Pickup

Built-in robotics and a machine-learning algorithm detect and warn you about incorrectly placed probes, since you can use either the automatic or manual tip loading feature. Access various error status report during probe loading to make sure you have the highest degree of accuracy.

The Most Intelligent Operating Software– Park SmartScan for FX Start to finish with 3 clicks of Park SmartScan™

1. Setup,
Auto Setting

It does all your setup including the probe change, and laser alignment for imaging.

2. Position,
Sample Navigation

It performs a frequency a sweep for the cantilever, and approaches the Z-stage to the sample, all automatically. Park FX40 with its added sample camera, it facilitates you to navigate for scanning to your area of interest, effortlessly.

3. Image!
Dynamic Scanning

The system sets all the necessary parameters for optimum scanning, then engages the cantilever and starts scanning the sample. It continues to scan until the image is acquired and completed with best results.

Park FX40 Specs

XY Scanner

Structure

▪ Single module flexure XY-scanner with closed-loop control

XY scan range

▪ Scan range : 100 µm × 100 µm(optional 10 µm × 10 µm or 50 µm × 50 µm)

Z Scanner

Structure

▪ Flexure guided high-force scanner

Z scan range

▪ 15 µm (optional 30 µm)

Sample mount

Sample size

▪ 20 mm x 20 mm recommended, thickness up to 20 mm

Mounting

▪ Magnetic holder (Max. 4 sample disc)
▪ FX Snap-in Sample Disk for Multi Snap-in Sample Chuck

Stages

XY stage travel range

▪ 105 mm x 40 mm (Motorized)

Z stage travel range

▪ 22 mm (Motorized)

Focus stage travel range

▪ 25 mm (Motorized)

Accessories

▪ Liquid Probehand
▪ Universal Liquid Cell with Temperature Control
▪ Temperature Controlled Stage 1, 2 and 3
▪ Electrochemistry Cell
▪ GloveBox
▪ High-field Magnetic Field Generator
▪ Tilting Sample Chuck

Auto Probe Exchange With automated probe exchange, users can now replace old probes easily and safely in full automation. Harnessing the convenience of an 8-probe cassette, along a magnetic controlled mechanism, probes can be mounted without the user handling them.

Auto Beam Alignment Automatic Beam Alignment positions the SLD beam onto the proper location of a cantilever and further optimizes the PSPD position both vertically and laterally. One simple click shifts the X,Y and Z axis for clearer images, with no distortion.

The Fastest and The Most Accurate, Scanning Mode in Atomic Force Microscopy The True Non-contact mode achieves unprecedented control over tip-sample distance at the sub-nanometer scale. The Park FX40 has a faster and more accurate True Non-contact mode than any other AFM on the market.

Safety Features

1. Setup, Auto Setting It does all your setup including the probe change, and laser alignment for imaging.

2. Position, Sample Navigation It performs a frequency a sweep for the cantilever, and approaches the Z-stage to the sample, all automatically. Park FX40 with its added sample camera, it facilitates you to navigate for scanning to your area of interest, effortlessly.

3. Image! Dynamic Scanning The system sets all the necessary parameters for optimum scanning, then engages the cantilever and starts scanning the sample. It continues to scan until the image is acquired and completed with best results.