-
Beads PolymerPatterns PetruPoni Semiconductor rubber Global_Comm UnivCollegeLondon fluorocarbon Chrome OpticalWaveguide HexagonalBoronNitride Composite IIT-chennai pinpoint mode DOE tip_bias_mode HiVacuum DeoxyribonucleicAcid TCS PhaseImaging AM-KPFM ScanningThermalMicroscopy Grain AAO sputter Mosfet HanyangUniv Potential biocompatible DiffractiveOpticalElements cooling StyreneBeads MeltingPoint amplitude_modulation Defect
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
AlSbAs
Scanning Conditions
- System: NX10
- Scan Mode: Tapping
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 1μm×1μm
- Scan Rate: 1Hz
- Pixel: 512×512
- Scan Mode: Tapping
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 1μm×1μm
- Scan Rate: 1Hz
- Pixel: 512×512