-
SmalScan Thermoplastic_polyurethane Galfenol Semiconductor cross section Butterfly Trench TungstenThinFilmDeposition Etch Corrosion WS2 fifber Croatia Lattice Polyurethane Alloy molecules PVA Global_Comm PatternedSapphireSubstrat Cobalt-dopedIronOxide ConductingPolymer CHRYSALIS_INC HighAcpectRatio PDMS FrequencyModulation AM-KPFM Self-assembledMonolayer DNA NanoLithography InorganicCompound Boundary ForceVolumeImage Adhesive Sadowski
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
ITO glass
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 20μm×20μm, 1μm×1μm
- Scan Rate: 0.2Hz, 0.5Hz
- Pixel: 512×512, 512×512
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 20μm×20μm, 1μm×1μm
- Scan Rate: 0.2Hz, 0.5Hz
- Pixel: 512×512, 512×512