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DIWafer I-VSpectroscopy TiO2 semifluorinated_alkanes Chemical_Vapor_Deposition BoronNitride Pyroelectric tip_bias_mode Switching BiFeO3 FrictionalForce PtfeFilter TemperatureControllerStage Protein Chloroform Inorganic SingleLayer PpLdpe multi_layer strontiu_titanate Phase Pinpoint Imprint Friction Pattern Optical Solution FrictionForce align 3-hexylthiophene Wang PMNPT PiezoelectricForceMicroscopy LDPE Sic
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PS/LDPE
Scanning Conditions
- System : FX40
- Scan Mode: PinPoint nanomechanical
- Scan Rate : 0.15 Hz
- Scan Size : 50μm×50μm
- Pixel Size : 256×256
- Cantilever : OMCL-AC160TS (k=26N/m, f=300kHz)