-
Scanning_Thermal_Microscopy PVAP3HT Carbon Switching CuParticle Adhesion ForceMapping ContactMode AM-KPFM AM_SKPM PMNPT Morphology SiWafer AdhesionForce HACrystal Mechinical Gold ThinFilm NTU Ucl frequency_modulation ItoGlass PtfeMembrane InsulatorFilm C60H122 GranadaUniv PANI Piezoresponse Bio PyroelectricDetector AdhesionEnergy silicon_oxide Solar self-assembled_monolayer Polytetrafluoroethylene
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
HOPG
Scanning Conditions
- System : FX40
- Scan Mode: Sideband, AM KPFM
- Scan Rate : 0.55 Hz
- Scan Size : 10μm×10μm
- Pixel Size : 256×256
- Cantilever : NSC36 Cr-Au C (k=0.6N/m, f=65kHz)