-
PVAP3HT MagneticForceMicroscopy Change MolybdenumDisulfide C60H122 IcelandSpar NUSNNI Ceramics cannabis 3-hexylthiophene EFMAmplitude Magnetic Neodymium Electrode DataStorage LateralPFM Cell Galfenol Hafnium_dioxide Flake light_emitting self-assembly ElectroDeposition food HydroGel HighResolution Permalloy Logo PUR Copolymer Boundary Ucl Ecoli PhaseTransition atomic_layer
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Multi-layer necking device defect
Scanning Conditions
- System : NX-Wafer
- Scan Mode: C-AFM
- Scan Rate : 2Hz
- Scan Size : 2μm×2μm
- Pixel Size : 512×256
- Cantilever : AD-2.8-AS (k=2.8N/m, f=75kHz)