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ContactModeDots Polystyrene Sapphire PinpointNanomechanicalMode Composition Device thermal_conductivity Corrosion FM_SKPM Lanthanum_aluminate GaP CrossSection RedBloodCell ThinFilm SiliconOxide PDMS BlockCopolymer 2d_materials Inorganic_Compound AM_SKPM Solution StrontiumTitanate Adhesion SFAs Leakage bias_mode Monisha Switching kelvin probe force microscopy HardDiskMedia Co/Cr/Pt Platinum solar_cell UnivOfMaryland CastIron
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Copper film
Scanning Conditions
- System : NX-Wafer
- Scan Mode: Non-contact
- Scan Rate : All 1Hz
- Scan Size : All 512μm×256μm
- Pixel Size : 512×512
- Cantilever : OMCL-AC160TS (k=26N/m, f=300kHz)