| Contact Us   Global
Report image

If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.

Please enter your name
Please enter your comment

WLI image of wafer ID mark

WLI_image_of_wafer_ID_mark

Scanning Conditions

- System : NX-Hybrid WLI
- Scan Mode: WLI
- Field of view: 182μm×182μm