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TemperatureControlledAFM Topography MagneticForceMicroscopy TappingMode gallium_nitride tip_bias_mode FAPbI3 Ptfe Pinpoint PFM small_scan MechanicalProperties CastIron NanoLithography PiezoelectricForceMicroscopy fluoroaalkane Polystyrene Electrode PFM Cobalt-dopedIronOxide PECurve thermal_conductivity ScanningThermalMicroscopy layers Device StrontiumTitanate Perovskite Mechanical Temperature Pvdf Polyvinylidene Trench PetruPoni Piezoresponse SmalScan conductive
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Star of Graphene
Scanning Conditions
- System : NX20
- Scan Mode: Non-contact
- Scan Rate : 0.6 Hz
- Scan Size : 2.5μm×2.5μm
- Pixel Size : 256×256
- Cantilever : Multi75-G (k=3N/m, f=75kHz)