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SThM ForceVolume amplitude_modulation sputter HexacontaneFilm Indium_tin_oxide dielectric trench nanomechanical Electrode Lateral_Force_Microscopy Memory PolyStylene SurfaceOxidation TempControl LightEmission SICM LiquidCell Permalloy doped KevlarFiber Vinylpyridine CntFilm bias_mode ForceDistanceSpectroscopy ScratchMode Ni-FeAlloy norganic Bacterium NiFe MESA structure Dimethicone Reading FM_SKPM Calcium Polarization
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Magnetic patterned array
Scanning Conditions
- System: NX10
- Scan Mode: MFM
- Cantilever: MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 1.7μm×1.7μm
- Scan Rate:0.5Hz
- Pixel:256×128
- Scan Mode: MFM
- Cantilever: MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 1.7μm×1.7μm
- Scan Rate:0.5Hz
- Pixel:256×128