Park AFM Image Gallery Download
Image Gallery 2021, Vol.04
01. Topography
Mica composite flake
Vincent van Gogh by e-beam litho
NbGaO3 with 0.4 nm terraces
ADS510 on hBN/SiO2
Polytetrafluoroethylene (PTFE)
Water droplet on HOPG
Moiré pattern of Graphene on hBN
Exfoliated Graphene on SiO2
Patterned surface of epitaxial SiC
F14H20 on Si
3D NAND flash
Post CMP wafer
Semiconductor process monitoring; CMP
Semiconductor process monitoring; Annealing
Semiconductor process monitoring; Exposure
Failure analysis; Defect analysis
Failure analysis; Position uniformity
Damage of PR patterns
LiNbO3 wafer
Copper foil
GaN film
ITO coated Quarts chip
Si grating
Fun grating
02. Advanced Mode
F14H20 on Si; Potential
Dot lithography on PZT; Potential
Park logo lithography on PZT; Potential
F14H20 on Si; Work function
BFO; PFM Images
PMN-PT; PFM Images
PMN-PT; Piezo response curves
HfO2; Electrical property
SAM on Au; STM
Au patterned PET; STM
Rubber with iron particles; Magnetic property
LDPS/PE; Thermal property
Vincent van Gogh; lithography
Santa with Rudolph; lithography
Christmas tree and firework; lithography
