The tip shape checker, TSC-200 is a reference material to check the overall shape of the AFM tip. If the certified linewidth (WC) is subtracted from the AFM line profile, the shape of the tip can be determined.
Specifications
Line width (WC): 200 nm
Reference pitch (PR): 600 nm
Trench width: 400 nm
Pattern depth (D): 1,000 nm (Not certified)
Pattern size: 4 mm × 1.3 mm (Certified area 3 mm)
Substrate: Rectangular coupon (9 × 18 mm)
Traceability: KOLAS (KRISS) traceable via ISO 17034:2016