Name: Park FX300 IR
Brand: Park Systems
Availability: InStoreOnly

Park FX300 IR

The most advanced 300 mm AFM with IR spectroscopy

Brochure Quotation

Key Features

FX300 IR AFM-IR spectroscopy head adjacent to sample for nanoscale chemical imaging

Park FX300 IR is Park Systems’ advanced AFM solution for nanoscale infrared spectroscopy and imaging, combining chemical and surface characterization. It is built on the proven FX300 platform supporting samples up to 300 mm, with low noise, minimal thermal drift, and high mechanical stability, ensuring reliable high-resolution metrology.

FX300 IR supports Photo-induced Force Microscopy (PiFM), enabling both IR spectral analysis and chemical imaging at the nanoscale. Like all Park AFMs, it features an orthogonal scan system and True Non-contact™ mode, delivering consistent, non-invasive measurements even on fragile samples.

Automation features such as automatic probe exchange, IR beam alignment, a full 300 mm sample-view camera, and multi-point measurement streamline operation and simplify workflows.

By combining high-performance AFM with advanced IR capability, FX300 IR provides a powerful platform for precise and efficient nanoscale chemical characterization.

Reliable Nano-IR Analysis

3D perspective view of Park Systems’ Nano-IR technology illustrating advanced nanoscale infrared analysis.

Automated Nano-IR Measurements

Built on the proven FX platform, Park FX300 IR automates probe exchange, laser alignment, and IR optimization.

Park SmartScan automatically optimizes the IR beam position for precise and efficient Nano-IR measurements.

Automatic IR Beam Alignment

SmartScan™ automatically finds the optimal IR beam position using real-time PiFM signal feedback.

True Non-Contact™ Nano-IR

Park FX300 IR performs fully non-contact IR measurements to prevent sample damage and tip contamination.

Illustration of nano-IR measurement using an IR laser and AFM tip to analyze surface and bulk properties.

Selectable Detection Modes

Direct and Sideband modes enable flexible nano-IR measurements, from strong signals to localized chemical contrast.

Park Advanced AFM Technology

Photo-induced Force Microscopy

Photo-induced Force Microscopy (PiFM) detects photo-induced forces generated by resonant molecular vibrations excited with a tunable IR laser. In Park FX300 IR, the AFM cantilever operates in Non-contact™ mode to measure local IR absorption without touching the sample, enabling spectral and chemical mapping with sub-5 nm spatial resolution and monolayer sensitivity.