Scanning probe microscopy application
Scanning Probe Microscopy
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Nanoindentation application
Nanoindentation

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Digital microscopy application
Digital Microscopy

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3D surface metrology application
3D Surface Metrology

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Confocal microscopy application
Confocal Microscopy

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Micromanipulation application
Micromanipulation

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Electron microscopy application
Electron Microscopy

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Mass photometry application
Mass Photometry

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Selected Applications
JEOL NeoScope scanning electron microscope on an Accurion i4 active vibration isolation system
Scanning Electron Microscope on Accurion i4 Medium
(JEOL NeoScope)
Sensofar profilometer on an Accurion i4 active vibration isolation system
3D Optical Profilometer on Accurion i4 Medium
(Sensofar Q vix)
Keyence VHX-6000 digital microscope on an Accurion i4 active vibration isolation system
Digital Microscope on Accurion i4 (Keyence VHX-6000)
Abberior microscope on an Accurion i4 active vibration isolation system
Super Resolution Microscope on Accurion i4 (abberior STEDYCON)
Molecular Vista 75 on Nano 30
Molecular Vista 75 on Nano 30
CSI Nano-Observer on Nano 20
CSI Nano-Observer on Nano 20
LEXT OLS5100 3D Laser Scanning Microscope on Park Systems Workstation Accurion Vario with steel frame and embedded optical breadboard, supporting larger, heavier applications
LEXT OLS5100 on Workstation i4
Park Systems Nikon Ti2 IVF Workstation, features stable design, medical-standard surface coating, and optional mobile cabinet.
Nikon Ti2 on IVF Workstation
Neaspec neaSNOM on a Park Systems Accurion Workstation Vario
Neaspec neaSNOM on Workstation Vario
Park Systems Accurion Vario Basic 40-600 modular vibration isolation system with two or more elements and external control unit, featuring a Polytec TMC-500 TopMap
Polytec TopMap on
Vario Basic
Performance Demonstration
Floating monolayer of ethylstearate, field of view 400 x 400 um
Floating Monolayer of Ethylstearate
Polymer drop on silicon substrate, field of view 50 x 50 um
Micromanipulation
Gold on carbon SiC wafer with graphene, field of view 0.5 x 0.5 um
Electron Microscopy
SiC wafer with graphene, field of view 0.5 x 0.5 um
Mass Photometry