Events

Magnetic force microscopy (MFM) is a Park Systems advanced AFM mode used for studying surfaces with magnetic properties by detecting the interaction between a magnetized cantilever and the sample surface. The AFM tip is coated with a layer of magnetic coating to probe the local magnetic field thus maintaining the spatial resolution of AFM. MFM is ideal for detecting the local magnetic properties and the spatial distribution of the samples at the nanoscale. This session will demonstrate how to acquire topographic information and magnetic variations over a sample surface simultaneously by using current NX hardware and software. The basic principle, instrumentation set-up, and data analysis will be covered.