Together with our Italian distributor G. Gambetti Tecnologia Srl, Park Systems will participate as a Gold Sponsor of the 13th Workshop on Spectroscopic Ellipsometry (WSE2026), taking place in Genova, Italy, from February 9 to 12, 2026.
- Date: February 9-12, 2026
- Location: Valletta Puggia Campus, University of Genova, Italy
- Link: https://www.wse2026.it/
Visit us on site to discuss current challenges in thin-film characterization and to experience Park Systems’ ellipsometry portfolio, building on Accurion’s long-standing expertise in spectroscopic ellipsometry. Our spectroscopic ellipsometers are designed for reliable optical characterization of thin films, surfaces, and interfaces — from fundamental research to advanced applications.
Accurion Simon Live Demo
We will have the Accurion Simon Spectroscopic Ellipsometer on site throughout the workshop. Learn how Simon supports precise, reproducible measurements with a compact and versatile design tailored for research environments.
Scientific Contribution
Talk Title: "Imaging Spectroscopic Ellipsometry (ISE): Extracting Pure Spectra by Cluster Analysis and Related Methods"
Presenter: Peter H. Thiesen
Co-authors: Daniel Severins, Arash Mirhamed, Matthias Duwe
Affiliation: ISE Support, Park Systems GmbH, Göttingen, Germany
Date and time: tbc
Imaging Spectroscopic Ellipsometry (ISE) enables pixel-resolved measurement of ellipsometric parameters, allowing the characterization of microscopic areas that are not accessible with conventional micro-spot ellipsometry. In addition to mapping layer thickness gradients, patterns, and defects, spectroscopic ISE provides a high information density that can be further exploited using multivariate, pixel-based analysis methods.
In this presentation, cluster analysis and related techniques are used to identify regions of interest and to extract pure spectra from samples with local thickness variations. Application examples range from flake identification in two-dimensional materials to time-optimized modeling of inhomogeneous samples. The approach is further demonstrated using spectroscopic micro-maps of a multi-crystalline sample, where clustering clearly distinguishes different micro-crystals and reveals spatially separated regions with similar optical properties.
Let’s Meet in Genova
Whether you want to discuss a specific measurement challenge, explore ellipsometry solutions, or see the Accurion Simon in person, we look forward to meeting you at WSE2026.