Webinar

From functional polymer composites to wearable electronics or 2D materials or biological structures, local variations in mechanical properties dictate the macroscopic properties. Here, atomic force microscopy offers more analytic insights beyond mere topography. In this webinar, we present how Park Systems’ PinPoint mode measures high-speed force-distance curves for each pixel which allows us to study mechanical properties like Young’s modulus, adhesion, or mechanical energy dissipation on a local scale. We will showcase how PinPoint mode enables facile integration of other modes such as conductive atomic force microscopy or piezo force microscopy and thus offers a holistic approach to nanoscale characterization. Finally, we will study the sweet side of science and demonstrate how to conduct real measurements on soft samples like chocolate and less-tasty polymer blends.