Conductive Atomic Force Microscopy of 2D Materials and Heterostructures for Nanoelectronics
Speaker : Dr. Filippo Giannazzo Affiliation : National Research Council of Italy, Italy Region : China Year : 2020 Language : English This lecture provides an in-depth exploration of Conductive Atomic Force Microscopy (C-AFM) applied to 2D materials and heterostructures for nanoelectronics. It discusses the synthesis and characterization of 2D materials like graphene, MoS2, and h-BN, and their potential applications in nanoelectronics. The talk also delves into the role of C-AFM in investigating charge transport phenomena in these materials at the nanoscale.
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