GaAs on PSS
Scanning Conditions
- System: NX20
- Scan Mode: True Non-Contact™ Mode
- Scan Rate: 1.2 Hz
- Scan Size: 1.5 µm×1.5 µm
- Pixel Size: 512×512
- Cantilever: AC55TS (k=85 N/m, f=1600 kHz)
Related Contents
System Webinars
Deeper insights into 2D-Materials and related Microcrystals by Imaging Spectroscopic Ellipsometry (ISE) and Imaging Mueller Matrix Ellipsometry (IMME)
Application Talks
Imaging Müller Matrix Ellipsometry for Quantifying Dielectric Tensors of Molecular Microcrystals as well as Analyzing Engineered Microstructures
Application Talks
Giant Optical Anisotropy and High Refractive Index in van der Waals Materials
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