CVD Grown WS₂

CVD Grown WS2

Scanning Conditions

- System: NX10
- Scan Mode: AM-KPFM
- Cantilever: NSC36Cr-Au A (k=1N/m, f=90kHz)
- Scan Size: 17μm×17μm
- Scan Rate: 0.3Hz
- Pixel Size: 512 × 256

Application

Semiconductor

Related Modes

Kelvin Probe Force Microscopy (KPFM)

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