Semiconductor device, W-plug

Semiconductor device W-plug 2

Scanning Conditions

- System: NX10
- Scan Mode: Conductive AFM
- Cantilever: ElectriMulti75-G (k=3N/m, f=75kHz)
- Scan Size: 2μm×1μm
- Scan Rate: 0.3Hz
- Pixel: 512×256
- Sample bias: +1V

Application

Semiconductor

Related Modes

Conductive AFM (C-AFM)

Related Contents

Sample Images

Epi Wafer
Application Notes

Advanced AFM Techniques for Studying Perovskite Materials
Application Notes

Moiré imaging with conductive atomic force microscopy
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