Topological insulator film
Metals & Ceramics
The topological insulator film was characterized in True Non-contact mode. The scan image reveals the surface topography with a peak-to-valley height of about 118.5 nm.
Scanning Conditions
- System: NX-Hivac
- Scan Mode: True Non-contact™ mode
- Scan Rate: 0.3 Hz
- Scan Size: 20 nm × 20 nm
- Pixel Size: 512 × 512 pixels
- Peak-to-valley: 118.5 µm
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