NanoScientific Magazine, FALL 2018

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  • Message from Editor
  • NanoScientific Symposiums: Registration Open for NanoScientific Symposium on SPM at SUNY Polytechnic Institute & NanoScientific Symposium on SPM Europe
  • Feature Article: “Insights into Submicron-Scales - Nanobubbles and Their Effect on AFM Measurements and Engineering Processes” Lisa Ditscherlein, Technical University Freiberg
  • Application Note: Differentiating Material Compositions using Lateral Force Microscopy
  • Feature Article: Tobias Cramer, Asst. Professor, Department of Physics and Astronomy, Bologna, Italy “An In Depth Look at Implantable Organic Nano Electronics”
  • Application Note: Simultaneous Topographical and Electrochemical Mapping using Scanning Ion Conductance Microscopy – Scanning Electrochemical Microscopy (SICM-SECM)
  • Feature Interview: Dr. Elliott D. Bloom- Professor of Particle Physics and Astrophysics, Emeritus Stanford- “High Energy Searches for Dark Matter using the Large Area Telescope on the Fermi Gamma-ray space observatory at Stanford”

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NanoScientific Magazine, Spring 2018

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  • Message from Editor
  • IN THE NEWS Call for Papers for NanoScientific Symposiums on SPM at SUNY Polytech Institute and Technical University Frieberg
  • Feature Article: Neuro Morphic Computing – How Materials and Devices with “brain like” Architecture are Revolutionizing Computing- an interview with Dr. Alain Diebold
  • Application Note: Electrical Conductivity Measurement of Carbon Nanotubes Film using Conductive Probe Atomic Force Microscopy (C-AFM)
  • Feature Article: 60 Grams from Asteroid Bennu May Reveal the History of our Solar System- an interview with Dr. Michael Daly
  • Application Note: PinPoint Piezoelectric Force Microscopy
  • Feature Article: Transforming Technology and Manufacturing in the Age of 3-D Printing
  • Park AFM Scholarship Winners Two new AFM Scholars Announced
  • Application Note: Using AFM PinPoint™Nanomechanical Mode for Quantification of Elastic Modulus in Materials Two Orders of Magnitude Faster than Force Volume Spectroscopy

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NanoScientific Magazine, Winter 2018

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  • Message from Editor
  • Feature Article: Using AFM to Identify Single Molecule Characterization, an interview with Francesco Ruggeri
  • Abridged Article: Detecting nanoscale vibrations as signature of life
  • In the News: Park Systems Opens Nanoscience Center at SUNY Polytechnic Institute
  • Park NX-Hivac: Phase-lock Loop for Frequency Modulation Non-Contact AFM
  • Electrochemical Atomic Force Microscopy (EC-AFM): In Situ Monitoring of Copper Electrodeposition on Gold Surface
  • Park AFM Scholarship Awards: Overwhelming Success Continues With Global Expansion

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NanoScientific Magazine, Fall 2017

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  • Message from Editor
  • Feature Article: “Smart on-demand Self Defensive Coatings of Biomedical Devices - How Self Activating Anti Biotics Work”
  • Application Note: Using Piezoresponse Force Microscopy to Observe Local Electromechanical Responses at Nanometer
  • Feature Story: Developing Energy from Natural Wood Without Corrosive Chemicals
  • Feature Interview: Park Systems AFM Luncheon at Semicon West Draws Standing Room Only Crowd
  • Application Note: Using KPFM with Park AFM to analyze electrical properties of metal, semiconductor device surfaces, organic and biological materials
  • In the News: Park Recognizes AFM Scholarship 2017 Awardees

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NanoScientific Magazine, Summer 2017

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  • Message from Editor
  • Techniques for Studying Atomic Legos and Breakthroughs in Superconductivity
  • Application Note: Imaging of Plasmid DNA in Liquid
  • Imec Reports in-line 3D AFM Provides Solutions for Semiconductor Manufacturers
  • Meeting Energy Needs of the 21st Century by Imaging NanoParticles
  • Park Opens European Headquarters in Heidelberg,Germany
  • Application Note: Fast Imaging Park NX10 AFM
  • Park Recognizes AFM Scholarship 2017 Awardees
  • Park Introduces Park NX12

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NanoScientific Magazine, Winter 2017

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  • Message from Editor
  • A Multidimensional and Multi Material Approach to Using Stem Cells
  • Fully Automated Atomic Force Microscopy Measurement and Analysis Using Park NX System
  • Semiconductor Spintronics: Electrical Spin Injection and Transport in Semiconductors
  • Ultra-High Resolution Atomic Force Microscopy
  • Scanning Capacitance Microscopy Characterization of Vacuum-Channel Nanoelectronic Devices
  • Park Announces AFM Scholarships for Graduate and Post Doc Students for Advanced Nano-Scientific Research
  • Park Tours Major Universities Giving AFM Lectures and Demos

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NanoScientific Magazine, Fall 2016

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  • Message from Editor: The Power of AFM
  • Current Trends in Spintronics and NanoStructured Materials
  • How highly efficient perovskite solar cells are visualized using AFM
  • Accelerating Yield Improvement by Finding & Eliminating Defects is the Key to Achieving “More Moore’s” and “More than Moore”
  • Electrical Characterization of Semiconductor Device Using SCM and KPFM Imaging
  • Hair Damage From Sunlight Radiation Observed Using AFM
  • Glimpses of the Nanoscale - Showcasing AFM images
  • Topography, Phase Imaging, and NanomechanicalProperty Investigation of Polyester Yarn Interaction with Silicon Matrix

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NanoScientific Magazine, Summer 2016

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  • Message from Editor / NanoTechnology
  • Commercializing Newest Nerve Regeneration Protocol and New Discoveries in the Field of Photonics
  • Studying Post-etching Silicon Crystal on 300 mm Wafer by Automatic Defect Review AFM
  • Nanowires for Optoelectronic Applications and the Unfolding Discoveries of the Physics of Light
  • Cellulose NanofibrilsTopography & Young's Modulus Imaging Using Park NX20
  • Webinars on ElectroChemistry, Smart Fluids, Stimuli-Responsive Polymers, Knotty Polymers and more
  • Industry News: Park Systems Global Expansion in AFM Market Includes Appointment of New Executives

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NanoScientific Magazine, Spring 2016

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  • Message from Editor / Nanotechnology in Nature
  • NanoFiber Research Creates Smart Nano Particles for Renewable Energy, Medical and Textiles
  • Using Scanning Ion Conductace Microscopy (SICM) to Understand the Movement of Ions in Complex Systems
  • Automatic Defect Review AFM with Enhanced Vision: Essential Tool for Hard Disk Media Failure Analysis
  • Research on Molecular Beam Epitaxy (MBE) for Integration of III-V Material Into Classical Silicon Architectures
  • IPO on the Horizon for Park Systems

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NanoScientific Magazine, Fall 2015

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  • Feature Interview: Micro Gravity - The Future of Innovation
  • Atomic Force Microscopy (AFM) for Optimization of Silica Chemical Inhibition in Geothermal Brines
  • Automated Non-Destructive Imaging and Characterization of Graphene/hBN Moiré Pattern with Non-Contact Mode AFM
  • Interview with Lloyd Whitman, Assistant Director for Nanotechnology at the White House Office of Science and Technology Policy
  • NX-Hivac High Vacuum SSRM AFM System
  • SmartScan: Customer Reviews & Positive Feedback

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